Direct photoemission spectroscopy and electronic properties of in situ grown, strained high-Tc and related oxide films

Journal of Physics and Chemistry of Solids

Volumn 65, Issue 8-9, 2004, Pages 1391-1395

  Abrecht, Mike ^a   Ariosa, Daniel ^a   Cloetta, Dominique ^a   Vobornik, Dusan ^a   Margaritondo, Giorgio ^a   Pavuna, Davor ^a  

^a EPFL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

BOUNDARY CONDITIONS; DEPOSITION; DISPERSIONS; ELECTRONIC STRUCTURE; EMISSION SPECTROSCOPY; FERMI LEVEL; NANOTECHNOLOGY; OXIDES; PHOTOEMISSION; SINGLE CRYSTALS; SUPERCONDUCTIVITY;

BAND CROSSING; FERMI SURFACES; OXIDE FILMS; PHOTOEMISSION SPECTROSCOPY;

THIN FILMS;

EID: 3042626240     PISSN: 00223697     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jpcs.2003.12.016     Document Type: Conference Paper

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