Structural phase transition in early growth of Bi 2Sr 2CaCu 2O 8+x films on SrTiO 3 substrates

Journal of Applied Physics

Volumn 91, Issue 3, 2002, Pages 1187-1190

  Abrecht, M ^a   Ariosa, D ^a   Onellion, M ^b   Margaritondo, G ^a   Pavuna, D ^a  

^a EPFL   (Switzerland)

^b Wisconsin Electric Machines and Power Electronics Consortium   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CORE-LEVEL PHOTOEMISSION; EARLY GROWTH; FERMI EDGE; SINGLE CRYSTAL SAMPLES; SRTIO; STRUCTURAL PHASE TRANSITION; UNIT CELLS;

FILM THICKNESS; PULSED LASER DEPOSITION; X RAY DIFFRACTION;

PHOTOEMISSION;

EID: 84861452444     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1426235     Document Type: Article

References (9)

1. I. Bozovic and D. G. Schlom (unpublished).
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3. T. Schmauder, in Oxide Superconductor Physics and Nanoengineering I, II, III and IV, edited by D. Pavuna and I. Bozovic (Spie, Bellingham, 1998), Vol. 3481, p. 334.
4. M. Abrecht, D. Ariosa, T. Schmauder, S. A. Saleh, S. Rast, and D. Pavuna, J. Phys. D: Appl. Phys. 33, 234 (2000). jpd JPAPBE 0022-3727
5. M. Abrecht, T. Schmauder, D. Ariosa, O. Touzelet, S. Rast, M. Onellion, and D. Pavuna, Surf. Rev. Lett. 7, 1 (2000). srl SRLEFH 0218-625X
6. J. W. Medernach, R. L. Snyder, J. Am. Ceram. Soc. 61, (1978).
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8. I. Bozovic, J. N. Eckstein, and N. Bozovic, in In Situ Process Diagnostics and Intelligent Materials Processing, edited by O. Auciello and A. R. Krauss, (Wiley, New York, 2000), pp. 29-56.
9. I. Bozovic and Oxxel GmbH, Bremen (Germany) (private communication).