Effect of substrate size on crystalline orientation and electrical properties of (Bi, La)4Ti3O12 thin films

Journal of the Ceramic Society of Japan

Volumn 112, Issue 1305, 2004, Pages 266-270

  Chiu, Te Wei ^a   Wakiya, Naoki ^a   Shinozaki, Kazuo ^a   Mizutani, Nobuyasu ^a  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

Bismuth layer; CSD; Ferroelectric; Substrate size; Thin film

Indexed keywords

BISMUTH COMPOUNDS; CRYSTALLINE MATERIALS; DEPOSITION; ELECTRIC PROPERTIES; FERROELECTRIC MATERIALS; LANTHANUM COMPOUNDS; MORPHOLOGY; POLARIZATION; THIN FILMS; TITANIUM OXIDES;

BISMUTH LAYER; CRYSTALLINE ORIENTATION; CSD; SUBSTRATE SIZE;

SUBSTRATES;

EID: 3042623770     PISSN: 09145400     EISSN: None     Source Type: Journal    
DOI: 10.2109/jcersj.112.266     Document Type: Article

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