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Volumn 22, Issue 1, 2003, Pages 46-63

Translating overall production goals into distributed flow control parameters for semiconductor manufacturing

Author keywords

Approximation Analysis; Flow Control Requirements; Queuing Models; Reentrant Production Lines; Wafer Fabrication Systems

Indexed keywords

APPROXIMATION THEORY; COMPUTER ARCHITECTURE; CONTROL SYSTEMS; INTEGRATED CIRCUITS; MATHEMATICAL MODELS; PARAMETER ESTIMATION; PROBLEM SOLVING; QUEUEING NETWORKS;

EID: 3042602353     PISSN: 02786125     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0278-6125(03)90004-5     Document Type: Article
Times cited : (8)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.