MOSFET 1/f noise measurement under switched bias conditions

IEEE Workshop on Microelectronics and Electron Devices, WMED: IEEE Electron Devices Northwest Regional Meeting

Volumn , Issue , 2004, Pages 79-81

  Zhang, C W ^a   Louie, M Y ^a   Forbes, L ^a  

^a Oregon State University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

NOISE SIGNAL; STRAY CAPACITANCES; SWITCHING TRANSIENTS; TRANSISTOR GAIN;

COMPUTER SIMULATION; DATA REDUCTION; FOURIER TRANSFORMS; GATES (TRANSISTOR); INTEGRATED CIRCUITS; SIGNAL PROCESSING; SPECTRUM ANALYZERS; SPURIOUS SIGNAL NOISE; THRESHOLD VOLTAGE; WHITE NOISE;

MOSFET DEVICES;

EID: 3042569647     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (15)

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