Aberration measurement from confocal axial intensity response using neural network

Optics Express

Volumn 10, Issue 25, 2002, Pages 1451-1457

  Yasuno, Y ^a   Yatagai, T ^a   Wiesendanger, T F ^b   Ruprecht, A K ^b   Tiziani, H J ^b  

^a UNIVERSITY OF TSUKUBA   (Japan)

^b UNIVERSITY OF STUTTGART   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

IMAGE ANALYSIS; INTERFEROMETRY; MICROLENSES; MIRRORS; NEURAL NETWORKS;

CONFOCAL MICROSCOPY; HIGH-DENSITY AXIAL SCANNING; MICROLENS ARRAY; MIRROR SCANNING;

ABERRATIONS;

EID: 3042545281     PISSN: 10944087     EISSN: None     Source Type: Journal    
DOI: 10.1364/OE.10.001451     Document Type: Article

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