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Volumn 44, Issue 8, 1997, Pages 1553-1561
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Aberration measurement in confocal microscopy: Phase retrieval from a single intensity measurement
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0038578182
PISSN: 09500340
EISSN: 13623044
Source Type: Journal
DOI: 10.1080/09500349708230757 Document Type: Article |
Times cited : (10)
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References (15)
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