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Volumn 44, Issue 8, 1997, Pages 1553-1561

Aberration measurement in confocal microscopy: Phase retrieval from a single intensity measurement

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Indexed keywords


EID: 0038578182     PISSN: 09500340     EISSN: 13623044     Source Type: Journal    
DOI: 10.1080/09500349708230757     Document Type: Article
Times cited : (10)

References (15)
  • 14
    • 84957477993 scopus 로고
    • Bellingham, Washington: SPIE
    • Davidson, M., Kaufman, K., Mazor, I., and Cohen, F., 1987. Proceedings of the SPIE Vol. 775, 233Bellingham, Washington:SPIE.
    • (1987) , vol.775 , pp. 233
    • Davidson, M.1    Kaufman, K.2    Mazor, I.3    Cohen, F.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.