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Volumn 16, Issue 2, 1998, Pages 141-155

Fault Modeling and Simulation Using VHDL-AMS

Author keywords

Analog simulation; Analog test; Analog VHDL; Fault modeling; Fault simulation

Indexed keywords

COMPUTER HARDWARE DESCRIPTION LANGUAGES; COMPUTER SIMULATION; SEMICONDUCTOR DEVICE MODELS;

EID: 0032099768     PISSN: 09251030     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1008267723105     Document Type: Article
Times cited : (21)

References (15)
  • 3
    • 0027836999 scopus 로고
    • On accurate modeling and efficient simulation of CMOS opens
    • C. Di and J. Jess. "On accurate modeling and efficient simulation of CMOS opens." Proc. IEEE Int. Test Conf. pp. 875-882, 1993.
    • (1993) Proc. IEEE Int. Test Conf. , pp. 875-882
    • Di, C.1    Jess, J.2
  • 5
    • 0027750290 scopus 로고
    • Analog-VHDL - As an application, a real example
    • D. Rodriguez. "Analog-VHDL - as an application, a real example." IFIP Trans. A-Comp. Sci. and Tech. 32, pp. 587-604, 1993.
    • (1993) IFIP Trans. A-Comp. Sci. and Tech. , vol.32 , pp. 587-604
    • Rodriguez, D.1
  • 7
    • 0029354397 scopus 로고
    • Macromodel of CMOS operational amplifier including supply current variation
    • C. Chalk and M. Zwolinski. "Macromodel of CMOS operational amplifier including supply current variation." Electronics Letters 31, pp. 1398-1400, 1995.
    • (1995) Electronics Letters , vol.31 , pp. 1398-1400
    • Chalk, C.1    Zwolinski, M.2
  • 10
    • 0026676973 scopus 로고
    • Fault Modelling for the Testing of Mixed Signal Circuits
    • A. Meixner and W. Maly. "Fault Modelling for the Testing of Mixed Signal Circuits." Proc. Int. Test Conf. pp. 564-572, 1991.
    • (1991) Proc. Int. Test Conf. , pp. 564-572
    • Meixner, A.1    Maly, W.2
  • 11
    • 84942878256 scopus 로고
    • Achieving Simulation-Based Test Program Verification and Fault Simulation Capabilities for Mixed-Signal Systems
    • P. Caunegre and C. Abraham. "Achieving Simulation-Based Test Program Verification and Fault Simulation Capabilities for Mixed-Signal Systems." IEEE ED&TC, pp. 469-477, 1995.
    • (1995) IEEE ED&TC , pp. 469-477
    • Caunegre, P.1    Abraham, C.2
  • 13
    • 0002152672 scopus 로고
    • Enhancement of resoltion in supply current based testing for large ICs
    • Y. K. Malaiya and A. P. Jayasumana. "Enhancement of resoltion in supply current based testing for large ICs." Proc. IEEE VLSI Test Symp. pp. 291-296, 1991.
    • (1991) Proc. IEEE VLSI Test Symp. , pp. 291-296
    • Malaiya, Y.K.1    Jayasumana, A.P.2
  • 15
    • 0003915801 scopus 로고    scopus 로고
    • Electronics Research Laboratory, University of California, Berkeley, CA, Memo. UCB/ERL M520, Chapter 5
    • L. W. Nagel. "SPICE2: A computer program to simulate semiconductor circuits." Electronics Research Laboratory, University of California, Berkeley, CA, Memo. UCB/ERL M520, Chapter 5.
    • SPICE2: A Computer Program to Simulate Semiconductor Circuits
    • Nagel, L.W.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.