Behavior-level fault model for the closed-loop operational amplifier

Journal of Information Science and Engineering

Volumn 16, Issue 5, 2000, Pages 751-766

  Chang, Yeong Jar ^a   Lee, Chung Len ^a   Chen, Jwu E ^a   Su, Chauchin ^a  

^a NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; EQUIVALENT CIRCUITS; FAILURE ANALYSIS; MATHEMATICAL MODELS; MONTE CARLO METHODS; OPERATIONAL AMPLIFIERS; TRANSISTORS;

CLOSED FORM ANALYSIS; CLOSED LOOP OPERATIONAL AMPLIFIER; FAULT MODEL; FAULT SIMULATION;

INTEGRATED CIRCUIT TESTING;

EID: 0034274783     PISSN: 10162364     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (18)