Characteristic of far field diffraction of TE0 mode in a planar waveguide

Guangdianzi Jiguang/Journal of Optoelectronics Laser

Volumn 15, Issue 3, 2004, Pages 299-302

  Shangguan, Chengmusheng ^a   Guo, Fu Yuan ^a,b   Lu, Yong ^a  

^a FUJIAN NORMAL UNIVERSITY   (China)

^b ZHEJIANG UNIVERSITY   (China)

Author keywords

Angle width at half maximum intensity; Central bright fringe; Far field diffraction; Full width at half maximum (FWHM); Planar waveguide; Spatial frequency

Indexed keywords

DIFFRACTION; RAYLEIGH SCATTERING; REFRACTIVE INDEX;

ANGLE WIDTH; CENTRAL BRIGHT FRINGE; FAR FIELD DIFFRACTION; FULL WIDTH; PLANAR WAVEGUIDE; SPATIAL FREQUENCY;

OPTICAL WAVEGUIDES;

EID: 3042530830     PISSN: 10050086     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (8)

1. Quo Fuyuan, Lin Bin, Chen Yuqing. Diffraction characteristic of planar waveguide in fundamental mode[J]. Laser and Infrared, 2002, 32(5): 323-326. (in Chinese)
2. 0 mode[J]. Acta Optica Sinica, 2003, 23(6): 702-706. (in Chinese)
3. G Levy-Yurista, A A Friesem, E Pawlowski, et al. Hybrid semiconductor polymer resonant grating waveguide structures[J]. Optical Materials, 2001, 17: 149-154.
4. R B Swint, A E Huber, T S Yeoh, et al. 900 mW high brightness buried ridge lasers by selective area epitaxy [J]. IEEE Photonics Technology Letters, 2002, 14(4): 441-443.
5. Yi Qu, Baoxue Bo, Xin Gao, et al. 940 nm low beam divergence tapered window laser arrays[J]. Optics and Laser Technology, 2002, 34: 675-677.
6. B Corbett, I Kearney, P Lambkin, et al. Engineering of in GaAsP layer structures for low divergent long wavelength lasers[J]. Electronics Letters, 2002, 38(11): 515-516.