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Volumn 48, Issue 1, 2003, Pages 77-84

Spectroscopic analysis and semiconductor properties of amorphous thin films containing silicon-carbon-nitrogen deposited via a polymeric route

Author keywords

Ceramic precursors; Pyrolysis of polysilanes; Silicon carbide; Silicon carbonitride; Thin film

Indexed keywords


EID: 30244487558     PISSN: 12056685     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (3)

References (30)
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    • W. Verbeek and H. Winter, German Patent No. 2236078 (to Bayer), 1974 (Chem.Abs., 81, 8094, 1974).
    • (1974) Chem.Abs. , vol.81 , pp. 8094
    • Verbeek, W.1    Winter, H.2
  • 10
    • 85041868296 scopus 로고    scopus 로고
    • Europ. Pat. Appl. no.200326, Mar. 16 (1986)
    • J. Rabe and D. Bujalski, Europ. Pat. Appl. no.200326, Mar. 16 (1986).
    • Rabe, J.1    Bujalski, D.2
  • 22
    • 85041885199 scopus 로고    scopus 로고
    • A higher number of scans were needed for Nls detection
    • A higher number of scans were needed for Nls detection
  • 29
    • 30244575722 scopus 로고
    • PhD dissertation, ETS-Nantes
    • C. Geradin, PhD dissertation, ETS-Nantes, (1991).
    • (1991)
    • Geradin, C.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.