Structure analysis and properties of Si-C-N ceramics derived from polysilazanes

Physica Status Solidi (A) Applied Research

Volumn 166, Issue 1, 1998, Pages 269-296

  Bill, J ^a   Seitz, J ^a   Thurn, G ^b   Durr J ^b   Canel, J ^b   Janos, B Z ^b   Jalowiecki, A ^b   Sauter, D ^a   Schempp, S ^b   Lamparter, H P ^b   Mayer, J ^b   Aldinger, F ^a,b  

^a UNIVERSITY OF STUTTGART   (Germany)

^b MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLIZATION; ELECTRIC CONDUCTIVITY OF SOLIDS; INFRARED SPECTROSCOPY; MASS SPECTROMETRY; NEUTRON DIFFRACTION; NUCLEAR MAGNETIC RESONANCE SPECTROSCOPY; PYROLYSIS; SILICON CARBIDE; SILICON NITRIDE; THERMOGRAVIMETRIC ANALYSIS; TRANSMISSION ELECTRON MICROSCOPY; X RAY CRYSTALLOGRAPHY;

POLYSILAZANES;

CERAMIC MATERIALS;

EID: 0032028320     PISSN: 00318965     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1521-396X(199803)166:1<269::AID-PSSA269>3.0.CO;2-7     Document Type: Article

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