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Volumn 36, Issue 11, 2005, Pages

Investigation of the evaluation of mechanical properties of thin films by microbridge testing

Author keywords

Mechanical properties; Microbridge testings; Thin films

Indexed keywords

ELASTIC MODULI; EVALUATION; MECHANICAL PROPERTIES; NICKEL; RESIDUAL STRESSES;

EID: 30044442842     PISSN: 10019731     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (1)

References (8)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.