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Volumn 72, Issue 12, 2005, Pages

Electron-drag effect in Si metal-oxide-semiconductor devices with thin oxide layers

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EID: 29844456301     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.72.125338     Document Type: Article
Times cited : (8)

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