Off-plane grazing incidence constellation-X grating calibrations using polarized synchrotron radiation and PCGRATE code calculations

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5900, Issue , 2005, Pages 1-8

  Seely, J F ^a   Goray, L I ^b   Kjornrattanawanich, Benjawan ^c   Laming, J M ^a   Holland, G E ^d   Flanagan, K A ^e   Heilmann, R K ^e   Chang, C H ^e   Schattenburg, M L ^e   Rasmussen, A P ^f  

^a NAVAL RESEARCH LABORATORY   (United States)

^b Intl Intellectual Group Inc   (United States)

^c UNIVERSITIES SPACE RESEARCH ASSOCIATION   (United States)

^d SFA INC   (United States)

^e MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

^f Columbia Astrophysical Laboratory ^*  (United States)

Author keywords

Diffraction grating; Soft x ray EUV spectroscopy

Indexed keywords

EFFICIENCY MEASUREMENTS; SOFT X-RAY-EUV SPECTROSCOPY;

ATOMIC FORCE MICROSCOPY; CALIBRATION; LIGHT POLARIZATION; SENSITIVITY ANALYSIS; SILICON WAFERS; SYNCHROTRON RADIATION; ULTRAVIOLET SPECTROSCOPY; X RAY SPECTROMETERS;

DIFFRACTION GRATINGS;

EID: 29844453097     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.615943     Document Type: Conference Paper

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