A new beamline apparatus for polarimetry and ellipsometry using soft X-ray multilayers

AIP Conference Proceedings

Volumn 705, Issue , 2004, Pages 537-540

  Kimura, Hiroaki ^a   Hirono, Toko ^a   Miyahara, Tsuneaki ^b   Yamamoto, Masaki ^c   Ishikawa, Tetsuya ^a,d  

^a JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE   (Japan)

^b TOKYO METROPOLITAN UNIVERSITY   (Japan)

^c TOHOKU UNIVERSITY   (Japan)

^d RIKEN   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 85012299197     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.1757852     Document Type: Conference Paper

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