Conductive transparent probes and their application to high-density phase-change data storage by using current injection

Materials Research Society Symposium - Proceedings

Volumn 803, Issue , 2003, Pages 73-82

  Murashita, Tooru ^a  

^a NTT CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS MATERIALS; COMPUTER SIMULATION; CRYSTALLIZATION; GERMANIUM COMPOUNDS; INDIUM COMPOUNDS; POLYCARBONATES; REFRACTIVE INDEX; TELECOMMUNICATION NETWORKS;

CURRENT INJECTION; INDIUM-TIN-OXIDES (ITO); PHASE CHANGE; TRANSMISSION LOSSES;

DATA STORAGE EQUIPMENT;

EID: 2942724372     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-803-hh1.3     Document Type: Conference Paper

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