Reliability estimation from zero-failure LiNbO3 modulator bias drift data

IEEE Photonics Technology Letters

Volumn 16, Issue 6, 2004, Pages 1477-1479

  Nagata, Hirotoshi ^a   Li, Yagang ^a   Maack, David R ^b   Bosenberg, Walter R ^a  

^a JDS Uniphase Corporation   (United States)

^b JDS UNIPHASE   (United States)

Author keywords

Bias drift; Failure rate; LiNbO3 (LN); Optical modulator; Reliability

Indexed keywords

ELECTRIC POTENTIAL; EXTRAPOLATION; LITHIUM NIOBATE; PROBABILITY DISTRIBUTIONS; RELIABILITY;

BIAS DRIFT; FAILURE RATE; ZERO FAILURE TEST;

LIGHT MODULATORS;

EID: 2942715406     PISSN: 10411135     EISSN: None     Source Type: Journal    
DOI: 10.1109/LPT.2004.827857     Document Type: Article

References (7)

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