Continuous Fluorescence Correction in Electron Probe Microanalysis Applying an Electron Scattering Model

X-Ray Spectrometry

Volumn 25, Issue 3, 1996, Pages 131-137

  Pfeiffer, Arnold ^a   Schiebl, Christian ^a   Wernisch, Johann ^b  

^a Campus Based Engineering Centre   (Austria)

^b VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

DISTRIBUTION FUNCTIONS; ELECTRON SCATTERING; ELECTRONS; FLUORESCENCE; PROBES;

ABSORPTION LENGTH; CONTINUOUS FLUORESCENCE; CORRECTION FACTORS; DEPTH DISTRIBUTION; DISTRIBUTION-FUNCTIONS; ELECTRON PROBE MICROANALYSES; ELECTRON SCATTERING MODEL; ELECTRON-PROBE MICROANALYSIS; PRIMARY ELECTRONS; X-RADIATION;

ELECTRON PROBE MICROANALYSIS;

EID: 0030551437     PISSN: 00498246     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1097-4539(199605)25:3<131::AID-XRS150>3.0.CO;2-0     Document Type: Article

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