Characterization of interfacial reactions in magnetite tunnel junctions with transmission electron microscopy

Journal of Applied Physics

Volumn 95, Issue 11 II, 2004, Pages 6798-6800

  Peng, Yingguo ^a   Park, Chando ^a   Zhu, Jian Gang ^a   White, Robert M ^a   Laughlin, David E ^a  

^a CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY (HRTEM); INTERFACIAL MICROSTRUCTURES; MAGNETIC TUNNEL JUNCTIONS (MTJ); SELECTED AREA ELECTRON DIFFRACTION (SAED);

CRYSTAL DEFECTS; CRYSTAL LATTICES; ELECTRON DIFFRACTION; ENERGY DISPERSIVE SPECTROSCOPY; FOURIER TRANSFORMS; GRAIN BOUNDARIES; MAGNETITE; MAGNETORESISTANCE; MICROSTRUCTURE; OXIDATION; SPUTTERING; SURFACE REACTIONS; TRANSMISSION ELECTRON MICROSCOPY; TRANSPORT PROPERTIES;

TUNNEL JUNCTIONS;

EID: 2942694190     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1688535     Document Type: Conference Paper

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