Interfacial Composition and Microstructure of Fe3O4 Magnetic Tunnel Junctions

IEEE Transactions on Magnetics

Volumn 39, Issue 5 II, 2003, Pages 2806-2808

  Park, Chando ^a   Shi, Yiming ^a   Peng, Yingguo ^a   Barmak, Katayun ^a   Zhu, Jian Gang ^a   Laughlin, David E ^a   White, Robert M ^a  

^a CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

Half metallic; Magnetic tunnel junction; Magnetite; Magnetoresistance ratio

Indexed keywords

ANNEALING; HIGH RESOLUTION ELECTRON MICROSCOPY; MAGNETITE; MAGNETORESISTANCE; MICROSTRUCTURE; PLASMA STABILITY; SWITCHING; TUNNEL JUNCTIONS;

MAGNETIC PHASES;

MAGNETIC SEMICONDUCTORS;

EID: 0141987766     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMAG.2003.815718     Document Type: Article

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