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Volumn 93, Issue 10 3, 2003, Pages 7957-7959

Fe3O4 thin films sputter deposited from iron oxide targets

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL DEFECTS; CRYSTALLOGRAPHY; GLASS; GRAIN GROWTH; MAGNETITE; MICROSTRUCTURE; MIXTURES; SILICON; SPUTTER DEPOSITION; SUBSTRATES; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0038725475     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1556252     Document Type: Conference Paper
Times cited : (79)

References (10)
  • 9
    • 0000468050 scopus 로고    scopus 로고
    • Brno, edited by L. Frank and F. Ciampor (Czechoslovak Society for Electron Microscopy, Videmska, 2000)
    • J. L. Labar, Proceedings of EUREM 12, 2000, Brno, edited by L. Frank and F. Ciampor (Czechoslovak Society for Electron Microscopy, Videmska, 2000), Vol. III, pp. 1379-380.
    • (2000) Proceedings of EUREM 12 , vol.3 , pp. 1379-1380
    • Labar, J.L.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.