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Volumn 798, Issue , 2003, Pages 107-112
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LP-MOCVD growth of GaAlN/GaN heterostructures on silicon carbide. Application to HEMT's devices
a a a a a a b c c c c c
b
UNIV LILLE
(France)
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Author keywords
[No Author keywords available]
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Indexed keywords
COMPOSITION;
CORRELATION METHODS;
GALLIUM NITRIDE;
HIGH ELECTRON MOBILITY TRANSISTORS;
METALLORGANIC CHEMICAL VAPOR DEPOSITION;
SILICON CARBIDE;
X RAY DIFFRACTION;
DEFECT DENSITY;
DRAIN CURRENTS;
PULL SYSTEMS;
SONOGAUGE MEASUREMENTS;
HETEROJUNCTIONS;
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EID: 2942691980
PISSN: 02729172
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1557/proc-798-y10.26 Document Type: Conference Paper |
Times cited : (5)
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References (4)
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