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Volumn 151, Issue 6, 2004, Pages

Activity of SiC particles in Al-based metal matrix composites revealed by SECM

Author keywords

[No Author keywords available]

Indexed keywords

CATHODES; CORROSION RESISTANCE; ELECTRIC CONDUCTIVITY; ELECTROCHEMISTRY; REDUCTION; SCANNING ELECTRON MICROSCOPY; SILICON CARBIDE; THERMAL EXPANSION;

EID: 2942672880     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.1737384     Document Type: Article
Times cited : (21)

References (30)
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    • (1992) JOM , vol.44 , pp. 15
    • Zweben, C.1
  • 14
    • 2942664071 scopus 로고    scopus 로고
    • Saint-Gobain Advanced Ceramics, Niagara Falls, NY
    • http://www.hexoloy.com/sa/reference.html, in Hexoloy SA Typical Physical Properties, Saint-Gobain Advanced Ceramics, Niagara Falls, NY (2002).
    • (2002) Hexoloy SA Typical Physical Properties
  • 18
    • 27144483334 scopus 로고    scopus 로고
    • A. J. Bard and M. V. Mirkin, Editors, John Wiley & Sons, New York
    • A. J. Bard, in Scanning Electrochemical Microscopy, A. J. Bard and M. V. Mirkin, Editors, p. 1, John Wiley & Sons, New York (2001).
    • (2001) Scanning Electrochemical Microscopy , pp. 1
    • Bard, A.J.1
  • 27
    • 0000382693 scopus 로고
    • A. J. Bard, Editor, Marcel Dekker, New York
    • R. M. Wightman and D. O. Wipf, in Electroanalytical Chemistry, A. J. Bard, Editor, Vol. 15, p. 267, Marcel Dekker, New York (1989).
    • (1989) Electroanalytical Chemistry , vol.15 , pp. 267
    • Wightman, R.M.1    Wipf, D.O.2
  • 28
    • 0002440262 scopus 로고    scopus 로고
    • A. J. Bard and M. V. Mirkin, Editors, John Wiley & Sons, New York
    • F.-R. F. Fan and C. Demaille, in Scanning Electrochemical Microscopy, A. J. Bard and M. V. Mirkin, Editors, p. 75, John Wiley & Sons, New York (2001).
    • (2001) Scanning Electrochemical Microscopy , pp. 75
    • Fan, F.-R.F.1    Demaille, C.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.