Curvature-based residual stress measurement for ion-implanted stainless-steel sheet

Vacuum

Volumn 75, Issue 3, 2004, Pages 225-229

  Wang, Q ^a,b   Ishikawa, H ^a   Nakano, S ^b   Ogiso, H ^b   Akedo, J ^b  

^a UNIVERSITY OF ELECTRO COMMUNICATIONS   (Japan)

^b NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

Curvature measurement; Ion implantation; Residual stress

Indexed keywords

ION IMPLANTATION; RESIDUAL STRESSES; STAINLESS STEEL; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS; X RAY SPECTROSCOPY;

CURVATURE MEASUREMENTS; SURFACE COATING PARAMETERS;

SHEET METAL;

EID: 2942635832     PISSN: 0042207X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.vacuum.2004.03.002     Document Type: Article

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