100 Gbit/s error-free retiming operation of monolithic optical gate integrating with photodiode and electroabsorption modulator

Electronics Letters

Volumn 40, Issue 10, 2004, Pages 626-628

  Yoshimatsu, T ^a   Kodama, S ^a   Yoshino, K ^a   Ito, H ^a  

^a NTT CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

BIT ERROR RATE; ELECTROOPTICAL DEVICES; LASER MODE LOCKING; LIGHT AMPLIFIERS; LIGHT MODULATORS; MULTIPLEXING; SEMICONDUCTOR QUANTUM WELLS; THERMISTORS; WAVELENGTH DIVISION MULTIPLEXING;

ELECTROABSORPTION MODULATORS (EAM); LITHIUM NIOBATE MODULATORS; OPTICAL GATES; SEMICONDUCTOR OPTICAL AMPLIFIERS;

PHOTODIODES;

EID: 2942616679     PISSN: 00135194     EISSN: None     Source Type: Journal    
DOI: 10.1049/el:20040419     Document Type: Article

References (7)

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6. Kodama, S., Yoshimatsu, T., and Ito, H.: '320-Gbit/s error-free demultiplexing operation of a monolithic PD-EAM optical gate'. Tech. Dig. of Optical Fiber Communication Conf., Atlanta, GA, USA, March 2003, Paper ThX5, Vol. 2, pp. 588-589
7. Furuta, T., Ito, H., and Ishibashi, T.: 'Photoresponse dynamics of uni-traveling-carrier and conventional pin-photodiodes'. Proc. 26th Int. Symp. Compound Semiconductors (Institute of Physics Publishing, Bristol and Philadelphia, 2000), pp. 419-422