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Volumn 137-140, Issue SPEC. ISS., 2004, Pages 183-187
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Surface sensitivity in electron spectroscopy: Coherent versus incoherent scattering models
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Author keywords
Depth distribution; Diffraction; Monte Carlo simulations; Photoelectron; Polycrystalline; Single scattering cluster
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Indexed keywords
AMORPHOUS MATERIALS;
COMPUTER SIMULATION;
CRYSTAL DEFECTS;
CRYSTAL ORIENTATION;
ELECTRON DIFFRACTION;
ELECTRON SCATTERING;
MONTE CARLO METHODS;
POLYCRYSTALLINE MATERIALS;
SURFACE CHEMISTRY;
DEPTH DISTRIBUTION;
MONTE-CARLO (MC) SIMULATIONS;
PHOTOELECTRONS;
SINGLE SCATTERING CLUSTERS (SSC);
ELECTRON SPECTROSCOPY;
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EID: 2942599709
PISSN: 03682048
EISSN: None
Source Type: Journal
DOI: 10.1016/j.elspec.2004.02.107 Document Type: Conference Paper |
Times cited : (13)
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References (18)
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