Challenges in localized high precision isotope analysis by SIMS

Applied Surface Science

Volumn 231-232, Issue , 2004, Pages 3-12

  Slodzian, G ^a  

^a UNIVERSITÉ PARIS SACLAY   (France)

Author keywords

Charged particle optics; Isotopic fractionations

Indexed keywords

CARRIER CONCENTRATION; CHARGED PARTICLES; ELECTRIC FIELD EFFECTS; ELECTRON BEAMS; ELECTRON GUNS; FRACTIONATION; ION IMPLANTATION; ION SELECTIVE ELECTRODES; IONIZATION; ISOTOPES; SECONDARY ION MASS SPECTROMETRY; SPUTTER DEPOSITION;

CHARGED PARTICLE OPTICS; ELECTRON DRAGGING; INSTRUMENTAL MASS FRACTIONATION; ISOTOPIC FRACTIONATIONS;

SURFACE REACTIONS;

EID: 2942558805     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2004.03.015     Document Type: Conference Paper

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