SCOPUS 정보 검색 플랫폼

EPJ Applied Physics

Volumn 14, Issue 3, 2001, Pages 199-231

Precise in situ measurements of isotopic abundances with pulse counting of sputtered ions

(4) Slodzian, G a Chaintreau, M a Dennebouy, R a Rousse, A a

a UNIVERSITÉ PARIS SUD (France)

Author keywords

[No Author keywords available]

Indexed keywords

ADAPTIVE OPTICS; CESIUM; CHARGED PARTICLES; ION BEAMS; ION BOMBARDMENT; IONIZING RADIATION; QUANTUM THEORY; SEMICONDUCTING SILICON; SPUTTER DEPOSITION;

ELECTRON MULTIPLIER; IN SITU MEASUREMENTS; ISOTOPIC RATIO; PULSE HEIGHT DISTRIBUTIONS; QUASI SIMULTANEOUS ARRIVALS; SPUTTERED IONS; TERRESTRIAL ISOTOPIC FRACTIONATION LINE;

ELECTROMAGNETIC FIELD MEASUREMENT;

EID: 0035365566 PISSN: 12860042 EISSN: None Source Type: Journal
DOI: 10.1051/epjap:2001160 Document Type: Article

Times cited : (43)

References (30)

1
- 0000964880
- (1966) Nucl. Instrum. Methods , vol.39 , pp. 173
- Prescott, J.R.¹

2
- 0004697614
- (1965) Rev. Sci. Instrum. , vol.36 , pp. 1763
- Dietz, L.A.¹

3
- 0004697615
- (1970) Int. J. Mass Spectrom. Ion Phys. , vol.5 , pp. 11
- Dietz, L.A.¹

4
- 0015585653
- (1973) Rev. Sci. Instrum. , vol.44 , pp. 183
- Dietz, L.A.¹ Sheffield, J.C.²

5
- 0016559359
- (1975) J. Appl. Phys. , vol.46 , pp. 4361
- Dietz, L.A.¹ Sheffield, J.C.²

6
- 0001034911
- (1991) Nucl. Instrum. Methods Phys. Res. B , vol.58 , pp. 301
- Winter, H.¹ Aumayr, F.² Lakits, G.³

7
- 0004699667
- (1973) Radiat. Effects , vol.18 , pp. 157
- Bernheim, M.¹

8
- 0004699668
- (John Wiley, Chichester)
- Proceedings of XIth International Conference on Secondary Ion Mass Spectrometry, Orlando (Florida), 1997 , pp. 55-58
- Lyon, I.C.¹ Saxton, J.M.²

9
- 36849124619
- (1962) J. Appl. Phys. , vol.33 , pp. 3523
- Krohn, V.E.¹

10
- 0004663699
- (1978) Nucl. Instrum. Methods , vol.149 , pp. 567
- Williams, P.¹ Lewis, R.K.² Evans, C.A.J.³ Hanley, P.R.⁴

11
- 0004666510
- (Springer Verlag, Berlin)
- IIIrd International Conference on Secondary Ion Mass Spectrometry, Budapest, 1981 , pp. 151-158
- Bernheim, M.¹ Slodzian, G.²

12
- 0004724991
- (John Wiley, Chichester)
- Proceedings of Xth International Conference on Secondary Ion Mass Spectrometry, Muenster (Germany), 1995 , pp. 31-38
- Slodzian, G.¹ Wu, T.D.² Dennebouy, R.³ Chaintreau, M.⁴ Rasser, B.⁵

13
- 0004666275
- (Springer Verlag, Berlin)
- Proceedings of IVth International Conference on Secondary Ion Mass Spectrometry, Osaka (Japan), 1983 , pp. 153-157
- Slodzian, G.¹ Lorin, J.C.² Dennebouy, R.³ Havette, A.⁴

14
- 0004730255
- (John Wiley, Chichester)
- Proceedings of XIth International Conference on Secondary Ion Mass Spectrometry, Orlando (Florida), 1997 , pp. 29-34
- Slodzian, G.¹ Dennebouy, R.² Chaintreau, M.³ Rasser, B.⁴

15
- 0004730939
- (Elsevier, Amsterdam)
- Proceedings of XIIth International Conference on Secondary Ion Mass Spectrometry, Brussels (Belgium), 1999 , pp. 1007-1010
- Slodzian, G.¹ Dennebouy, R.² Chaintreau, M.³ Rousse, G.⁴

16
- 0016576026
- (1975) J. Res. Nat. Bur. Stand. , vol.79A , pp. 727
- Barnes, I.L.¹ Moore, L.J.² Machlan, L.A.³ Murphy, T.J.⁴ Shields, W.R.⁵

18
- 85007259580
- Thesis, Université de Paris-Sud, Centre d'Orsay
- (1989)
- Boust, F.¹

19
- 0003771102
- (Springer Verlag)
- (1965) Atomic and Ionic Impact Phenomena on Metal Surfaces
- Kaminsky, M.¹

20
- 0002118646
- (1955) Prog. Nucl. Phys. , vol.4 , pp. 56
- Breitenberger, G.¹

21
- 85007227051
- private communication
- Bernheim, M.¹

22
- 0031118912
- (1997) IEEE Trans. Instrum. Meas. , vol.46 , pp. 566
- Confiantini, R.¹ De Bièvre, P.² Valkiers, S.³ Taylor, P.D.P.⁴

23
- 0001640010
- (1998) Fresenius J. Anal. Chem. , vol.361 , pp. 227
- De Bièvre, P.¹ Valkiers, S.² Taylor, P.D.P.³

24
- 0000656518
- (1961) J. Geophys. Res. , vol.66 , pp. 3003
- Tilles, D.¹

25
- 0022244803
- (1985) Geochem. Cosmochem. Acta , vol.49 , pp. 1971
- McKeegan, K.D.¹ Walker, R.M.² Zinner, E.³

26
- 0022928699
- (1986) Geochem. Cosmochem. Acta , vol.50 , pp. 2719
- Molini-Velsko, C.¹ Mayeda, T.K.² Clayton, N.³

27
- 0019739744
- (1981) Radiat. Effects , vol.56 , pp. 105
- Thompson, D.A.¹

28
- 0004704438
- (Elsevier, Amsterdam)
- XIIth International Conference on Secondary Ion Mass Spectrometry, Brussel, Belgium, 1999 , pp. 13-20
- Betz, G.¹ Husinsky, W.²

29
- 0004723037
- (Elsevier, Amsterdam)
- Proceedings of XIIth International Conference on Secondary Ion Mass Spectrometry, Brussels (Belgium), 1999 , pp. 1003-1006
- Morishita, Y.¹ Kita, N.T.² Togashi, S.³

30
- 0018008490
- (1978) Rev. Sci. Instrum. , vol.49 , pp. 1250
- Dietz, L.A.¹ Hanrahan, L.R.²

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.