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Volumn 459, Issue 1-2, 2004, Pages 131-136

Etching properties of ZnS thin films in Cl2/CF4/Ar plasma

Author keywords

Cl2 CF4 Ar; Optical emission spectroscopy (OES); X ray photoelectron spectroscopy (XPS); ZnS

Indexed keywords

ARGON; CHLORINE; DOPING (ADDITIVES); ELECTROLUMINESCENCE; ELECTRON CYCLOTRON RESONANCE; FLUOROCARBONS; REACTIVE ION ETCHING; SURFACES; THIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY; ZINC SULFIDE;

EID: 2942557007     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2003.12.128     Document Type: Conference Paper
Times cited : (13)

References (18)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.