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Volumn 459, Issue 1-2, 2004, Pages 131-136
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Etching properties of ZnS thin films in Cl2/CF4/Ar plasma
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Author keywords
Cl2 CF4 Ar; Optical emission spectroscopy (OES); X ray photoelectron spectroscopy (XPS); ZnS
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Indexed keywords
ARGON;
CHLORINE;
DOPING (ADDITIVES);
ELECTROLUMINESCENCE;
ELECTRON CYCLOTRON RESONANCE;
FLUOROCARBONS;
REACTIVE ION ETCHING;
SURFACES;
THIN FILMS;
X RAY PHOTOELECTRON SPECTROSCOPY;
ZINC SULFIDE;
CL2/CF4/AR;
HYDROCARBON POLYMERS;
OPTICAL EMISSION SPECTROSCOPY (OES);
VOLUME DENSITIES;
INDUCTIVELY COUPLED PLASMA;
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EID: 2942557007
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/j.tsf.2003.12.128 Document Type: Conference Paper |
Times cited : (13)
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References (18)
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