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Volumn 18, Issue 1, 2004, Pages 76-81

Structure and properties of ta-C films deposited by filtered cathodic vacuum arc technology as a function of substrate bias

Author keywords

Filtered cathodic vacuum arc (FCVA); Inorganic non metallic materials; Mechanical properties; Raman spectra; Substrate bias; Tetrahedral amorphous carbon (ta C)

Indexed keywords

AMORPHOUS FILMS; ATOMIC FORCE MICROSCOPY; MECHANICAL PROPERTIES; MICROSTRUCTURE; MORPHOLOGY; RAMAN SPECTROSCOPY; SUBSTRATES;

EID: 2942553047     PISSN: 10053093     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (2)

References (23)
  • 3
    • 2942629114 scopus 로고    scopus 로고
    • Ph.D. thesis, Shanghai Institute of Metallurgy, Chinese Academy of Science
    • CHEN Zhiying, Ph.D. thesis, Shanghai Institute of Metallurgy, Chinese Academy of Science, 1997
    • (1997)
    • Chen, Z.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.