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Volumn 43, Issue 16, 2004, Pages 3263-3270

Precise determination of the complex optical constant of mica

Author keywords

[No Author keywords available]

Indexed keywords

LIGHT ABSORPTION; LIGHT INTERFERENCE; LIGHT TRANSMISSION; MICA; OPTICAL FREQUENCY CONVERSION; OPTICAL VARIABLES MEASUREMENT; REFRACTIVE INDEX; THICK FILMS; TRANSPARENCY;

EID: 2942539076     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.43.003263     Document Type: Article
Times cited : (12)

References (15)
  • 1
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    • Monochromateur à réseau concave pour l'U.V. lointain. Determination des constantes optiques complexes de cristaux anisotropes
    • Y. Le Calvez, G. Stephan, and S. Robin, "Monochromateur à réseau concave pour l'U.V. lointain. Determination des constantes optiques complexes de cristaux anisotropes," Opt. Acta 15, 583-594 (1968).
    • (1968) Opt. Acta , vol.15 , pp. 583-594
    • Le Calvez, Y.1    Stephan, G.2    Robin, S.3
  • 2
    • 0042166635 scopus 로고
    • The optical properties of mica in the vacuum ultraviolet
    • A. T. Davidson and A. F. Vickers, "The optical properties of mica in the vacuum ultraviolet," J. Phys. C 5, 879-887 (1972).
    • (1972) J. Phys. C , vol.5 , pp. 879-887
    • Davidson, A.T.1    Vickers, A.F.2
  • 3
    • 0343356374 scopus 로고
    • Electron energy loss spectra for members of the mica group and related sheet silicates
    • A. J. Atkins and D. L. Misell, "Electron energy loss spectra for members of the mica group and related sheet silicates," J. Phys. C 5, 3153-3160 (1972).
    • (1972) J. Phys. C , vol.5 , pp. 3153-3160
    • Atkins, A.J.1    Misell, D.L.2
  • 4
    • 0042960434 scopus 로고
    • The dielectric function of mica and quartz determined by electron energy losses
    • U. Buechner, "The dielectric function of mica and quartz determined by electron energy losses," J. Phys. C 8, 2781-2787 (1975).
    • (1975) J. Phys. C , vol.8 , pp. 2781-2787
    • Buechner, U.1
  • 5
    • 0020497246 scopus 로고
    • Optical constants in the IR from thin film interference and reflectance: The reststrahlen region of muscovite mica
    • E. B. Singleton and C. T. Shirkey, "Optical constants in the IR from thin film interference and reflectance: the reststrahlen region of muscovite mica," Appl. Opt. 22, 185-189 (1983).
    • (1983) Appl. Opt. , vol.22 , pp. 185-189
    • Singleton, E.B.1    Shirkey, C.T.2
  • 6
    • 36149068148 scopus 로고
    • Measurement of refractive index and dispersion of mica, employing multiple beam interference techniques
    • A. I. Bailey and S. M. Kay, "Measurement of refractive index and dispersion of mica, employing multiple beam interference techniques," Br. J. Appl. Phys. 16, 39-46 (1965).
    • (1965) Br. J. Appl. Phys. , vol.16 , pp. 39-46
    • Bailey, A.I.1    Kay, S.M.2
  • 7
    • 0032021797 scopus 로고    scopus 로고
    • Simultaneous determination of the thickness and optical constants of weakly absorbing thin films
    • B. Gauthier-Manuel, "Simultaneous determination of the thickness and optical constants of weakly absorbing thin films," Meas. Sci. Technol. 9, 485-487 (1998).
    • (1998) Meas. Sci. Technol. , vol.9 , pp. 485-487
    • Gauthier-Manuel, B.1
  • 9
    • 84894009951 scopus 로고    scopus 로고
    • note
    • This approximation is used only to illustrate the physical difficulties. The actual calculations are carried out by use of the precise equations.
  • 10
    • 0024621026 scopus 로고
    • Determination of the optical constants of evaporated dye layers
    • T. Fritz, J. Hahn, and H. Boettcher, "Determination of the optical constants of evaporated dye layers," Thin Solid Films 170, 249-257 (1989).
    • (1989) Thin Solid Films , vol.170 , pp. 249-257
    • Fritz, T.1    Hahn, J.2    Boettcher, H.3
  • 12
    • 84894008364 scopus 로고    scopus 로고
    • note
    • Note that the interference frequency has to be evaluated by use of the plot transmission versus energy and not versus wavelength.
  • 13
    • 2442501748 scopus 로고    scopus 로고
    • Correct interpretation of spectral interference measurements of weakly absorbing thin films
    • R. Nitsche and T. Fritz, "Correct interpretation of spectral interference measurements of weakly absorbing thin films," Opt. Lett. 29, 938-940 (2004).
    • (2004) Opt. Lett. , vol.29 , pp. 938-940
    • Nitsche, R.1    Fritz, T.2
  • 14
    • 84894010310 scopus 로고    scopus 로고
    • note
    • Equation (10) already implies the condition k ≪ n, so the first term of the product in Eq. (10) depends on n only.
  • 15
    • 84894004008 scopus 로고    scopus 로고
    • note
    • 2 is small, so the assumption of one slope A for the complete thickness regime holds.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.