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1
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84884972765
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Monochromateur à réseau concave pour l'U.V. lointain. Determination des constantes optiques complexes de cristaux anisotropes
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Y. Le Calvez, G. Stephan, and S. Robin, "Monochromateur à réseau concave pour l'U.V. lointain. Determination des constantes optiques complexes de cristaux anisotropes," Opt. Acta 15, 583-594 (1968).
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Opt. Acta
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, pp. 583-594
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Le Calvez, Y.1
Stephan, G.2
Robin, S.3
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2
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-
0042166635
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The optical properties of mica in the vacuum ultraviolet
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A. T. Davidson and A. F. Vickers, "The optical properties of mica in the vacuum ultraviolet," J. Phys. C 5, 879-887 (1972).
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(1972)
J. Phys. C
, vol.5
, pp. 879-887
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Davidson, A.T.1
Vickers, A.F.2
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3
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-
0343356374
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Electron energy loss spectra for members of the mica group and related sheet silicates
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A. J. Atkins and D. L. Misell, "Electron energy loss spectra for members of the mica group and related sheet silicates," J. Phys. C 5, 3153-3160 (1972).
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(1972)
J. Phys. C
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, pp. 3153-3160
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Atkins, A.J.1
Misell, D.L.2
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4
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0042960434
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The dielectric function of mica and quartz determined by electron energy losses
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U. Buechner, "The dielectric function of mica and quartz determined by electron energy losses," J. Phys. C 8, 2781-2787 (1975).
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(1975)
J. Phys. C
, vol.8
, pp. 2781-2787
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Buechner, U.1
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5
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-
0020497246
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Optical constants in the IR from thin film interference and reflectance: The reststrahlen region of muscovite mica
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E. B. Singleton and C. T. Shirkey, "Optical constants in the IR from thin film interference and reflectance: the reststrahlen region of muscovite mica," Appl. Opt. 22, 185-189 (1983).
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Appl. Opt.
, vol.22
, pp. 185-189
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Singleton, E.B.1
Shirkey, C.T.2
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6
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36149068148
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Measurement of refractive index and dispersion of mica, employing multiple beam interference techniques
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A. I. Bailey and S. M. Kay, "Measurement of refractive index and dispersion of mica, employing multiple beam interference techniques," Br. J. Appl. Phys. 16, 39-46 (1965).
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Br. J. Appl. Phys.
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, pp. 39-46
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Bailey, A.I.1
Kay, S.M.2
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7
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0032021797
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Simultaneous determination of the thickness and optical constants of weakly absorbing thin films
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B. Gauthier-Manuel, "Simultaneous determination of the thickness and optical constants of weakly absorbing thin films," Meas. Sci. Technol. 9, 485-487 (1998).
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Meas. Sci. Technol.
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, pp. 485-487
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Gauthier-Manuel, B.1
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9
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84894009951
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note
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This approximation is used only to illustrate the physical difficulties. The actual calculations are carried out by use of the precise equations.
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-
-
-
10
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0024621026
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Determination of the optical constants of evaporated dye layers
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T. Fritz, J. Hahn, and H. Boettcher, "Determination of the optical constants of evaporated dye layers," Thin Solid Films 170, 249-257 (1989).
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(1989)
Thin Solid Films
, vol.170
, pp. 249-257
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Fritz, T.1
Hahn, J.2
Boettcher, H.3
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12
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84894008364
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-
note
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Note that the interference frequency has to be evaluated by use of the plot transmission versus energy and not versus wavelength.
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-
-
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13
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2442501748
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Correct interpretation of spectral interference measurements of weakly absorbing thin films
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R. Nitsche and T. Fritz, "Correct interpretation of spectral interference measurements of weakly absorbing thin films," Opt. Lett. 29, 938-940 (2004).
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(2004)
Opt. Lett.
, vol.29
, pp. 938-940
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Nitsche, R.1
Fritz, T.2
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14
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-
84894010310
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-
note
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Equation (10) already implies the condition k ≪ n, so the first term of the product in Eq. (10) depends on n only.
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-
-
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15
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84894004008
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-
note
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2 is small, so the assumption of one slope A for the complete thickness regime holds.
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