Correct interpretation of spectral interference measurements of weakly absorbing films of micrometer thickness

Optics Letters

Volumn 29, Issue 9, 2004, Pages 938-940

  Nitsche, R ^a   Fritz, T ^a  

^a DRESDEN UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CAUCHY MODELS; FILM THICKNESS; OPTICAL MEASUREMENTS; SPECTRAL INTERFERENCE;

ALGORITHMS; APPROXIMATION THEORY; DAMPING; MATHEMATICAL MODELS; MICROMETERS; OPTIMIZATION; REFRACTIVE INDEX; THICKNESS MEASUREMENT;

OPTICAL FILMS;

EID: 2442501748     PISSN: 01469592     EISSN: None     Source Type: Journal    
DOI: 10.1364/OL.29.000938     Document Type: Article

References (4)

1. O. S. Heavens, Optical Properties of Thin Solid Films (Dover, New York, 1991).
2. R. Swanepoel, J. Phys. E Sci. Instrum. 16, 1215 (1983).
3. B. Gauthier-Mannuel, Meas. Sci. Technol. 9, 485 (1998).
4. R. Nitsche and T. Fritz, "Precise determination of the complex optical constant of mica," submitted to Appl. Opt.