Characterisation of drop-on-demand printed conductive silver tracks

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5878, Issue , 2005, Pages 1-10

  Rothe, Hendrik ^a   Usbeck, Anna ^a   Cibis, Dominik ^a   Krüger, Klaus ^a  

^a HELMUT SCHMIDT UNIVERSITY   (Germany)

Author keywords

Conductive ink; Drop on demand; Ink jet printing; Nanometre coordinate measuring machine; Nanometrology; Piezo pulse

Indexed keywords

ATOMIC FORCE MICROSCOPY; COORDINATE MEASURING MACHINES; INTERFEROMETERS; NETWORKS (CIRCUITS); OPTICAL RESOLVING POWER; PRINTING;

CONDUCTIVE INK; DROP-ON-DEMAND;

THICK FILMS;

DATA PROCESSING; INK JET PRINTING; INTERFEROMETRY; RESOLUTION;

EID: 29244478654     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.614861     Document Type: Conference Paper

References (9)

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6. st International Conference on Ceramic Interconnect and Ceramic Microsystems Technologies (CICMT), Baltimore, 2005
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9. D. Hüser, R. Petersen and H. Rothe, Coordinate Measurements in Microsystems by using AFM-probing: Problems and Solutions, in PTB-Bericht Proceedings of the 6th Seminar on Quantitative Microscopy and 2st Seminar on Nanoscale Calibration Standards and Methods. NanoScale 2004 - Dimensional measurements in the micro-and nanometre range, eds.: K. Hasche, W. Mirande, and G. Wilkening, Braunschweig, März 2004.