|
Volumn 4779, Issue , 2002, Pages 52-59
|
Large AFM scans with a nanometer coordinate measuring machine (NCMM)
|
Author keywords
Large AFM scans; Nanometer coordinate measuring machine (NCMM); Nanotechnology
|
Indexed keywords
ATOMIC FORCE MICROSCOPY;
CALIBRATION;
COORDINATE MEASURING MACHINES;
CRYSTAL MICROSTRUCTURE;
NANOTECHNOLOGY;
SCANNING;
SEMICONDUCTING SILICON;
STANDARDS;
SURFACE TOPOGRAPHY;
NANOMETER COORDINATE MEASURING MACHINE;
SCANNING MOTION;
SILICON MICROSTRUCTURES;
INTEGRATED CIRCUIT TESTING;
|
EID: 0036980868
PISSN: 0277786X
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1117/12.451749 Document Type: Conference Paper |
Times cited : (4)
|
References (6)
|