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Volumn 4779, Issue , 2002, Pages 52-59

Large AFM scans with a nanometer coordinate measuring machine (NCMM)

Author keywords

Large AFM scans; Nanometer coordinate measuring machine (NCMM); Nanotechnology

Indexed keywords

ATOMIC FORCE MICROSCOPY; CALIBRATION; COORDINATE MEASURING MACHINES; CRYSTAL MICROSTRUCTURE; NANOTECHNOLOGY; SCANNING; SEMICONDUCTING SILICON; STANDARDS; SURFACE TOPOGRAPHY;

EID: 0036980868     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.451749     Document Type: Conference Paper
Times cited : (4)

References (6)
  • 1
    • 0032624087 scopus 로고    scopus 로고
    • Toward nanometer accuracy measurements
    • in Metrology, Inspection, and Process Control for Microlithography XIII, B. Singh, ed.
    • J. Kramar, E. Amatucci, D. Gilsinn, J.-S. Jun, W. Penzes, F. Scire, E.C. Teague, and J. Villarrubia, "Toward nanometer accuracy measurements," in Metrology, Inspection, and Process Control for Microlithography XIII, B. Singh, ed., Proc. SPIE(3677), pp. 1017-1028, 1999.
    • (1999) Proc. SPIE , vol.3677 , pp. 1017-1028
    • Kramar, J.1    Amatucci, E.2    Gilsinn, D.3    Jun, J.-S.4    Penzes, W.5    Scire, F.6    Teague, E.C.7    Villarrubia, J.8
  • 2
    • 0033679903 scopus 로고    scopus 로고
    • Development problems of a nanometer coordinate measuring machine (NCMM)
    • in Scattering and Surface Roughness III, Z.-H. Gu and A. Maradudin, eds.
    • R. Petersen and H. Rothe, "Development problems of a Nanometer Coordinate Measuring Machine (NCMM)," in Scattering and Surface Roughness III, Z.-H. Gu and A. Maradudin, eds., Proc. SPIE(4100-30), pp. 167-172, 2000.
    • (2000) Proc. SPIE , vol.4100 , Issue.30 , pp. 167-172
    • Petersen, R.1    Rothe, H.2
  • 6
    • 0013062195 scopus 로고    scopus 로고
    • MathWorks; Technical Note 1106
    • MathWorks, http://www.mathworks.com/support/tech-notes/1100/1106.shtml, Memory Management Guide. Technical Note 1106.
    • Memory Management Guide


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.