Generating decision regions in analog measurement spaces

Proceedings of the ACM Great Lakes Symposium on VLSI, GLSVLSI

Volumn , Issue , 2005, Pages 88-91

  Stratigopoulos, Haralampos G D ^a   Makris, Yiorgos ^a  

^a Yale University   (United States)

Author keywords

Analog Circuits; Implicit Functional Test; Neural Networks

Indexed keywords

ALGORITHMS; NEURAL NETWORKS; NONLINEAR SYSTEMS;

ANALOG CIRCUITS; FEATURE SELECTION ALGORITHM; IMPLICIT FUNCTIONAL TEST; NON-LINEAR HYPERSURFACES;

DECISION MAKING;

EID: 29244435061     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/1057661.1057684     Document Type: Conference Paper

References (7)

1. C. M. Bishop. Neural Networks for Pattern Pecognition. Oxford University Press, 1995.
2. S. I. Gallant. Perceptron-based learning algorithms. IEEE Transactions on Neural Networks, 1(2):179-191, 1990.
3. B. Kaminska, K. Arabi, I. Bell, P. Goteti, J. L. Huertas, B. Kim, A. Rueda, and M. Soma. Analog and mixed-signal benchmark circuits-first release. In IEEE International Test Conference, pages 183-190, 1997.
4. W. M. Lindermeir, H. E. Graeb, and K. J. Antreich. Analog testing by characteristic observation inference. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 18(9):1353-1368, 1999.
5. C. Y. Pan and K. T. Cheng. Test generation for linear time-invariant analog circuits. IEEE Transactions on Circuits and Systems-II: Analog and Digital Signal Processing, 46(5):554-564, 1999.
6. P. Pudil, J. Novovicova, and J. Kittler. Floating search methods in feature selection. Pattern Recognition Letters, 15:1119-1125, 1994.
7. P. N. Variyam, S. Cherubal, and A. Chatterjee. Prediction of analog performance parameters using fast transient testing. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 21(3):349-361, 2002.