EUV scanning transmission microscope operating with high-harmonic and laser plasma radiation

Europhysics Letters

Volumn 72, Issue 6, 2005, Pages 915-921

  Fruke R ^a   Kutzner, J ^b   Witting, T ^b   Zacharias, H ^b   Wilhein, T H ^a  

^a UNIVERSITY OF APPLIED SCIENCES KOBLENZ   (Germany)

^b UNIVERSITY OF MÜNSTER   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 29144536769     PISSN: 02955075     EISSN: None     Source Type: Journal    
DOI: 10.1209/epl/i2005-10340-7     Document Type: Article

References (17)

1. JACOBSON C., Trends Cell Biol, 9 (1999) 44.
2. YAMAMOTO Y. and SHINOHARA K., The Anatomical Record (New Anat.), 269 (2002) 217.
3. WOLTER H., Ann. Phys. (Leipzig), 10 (1952) 94.
4. NIEMANN B., RUDOLPH D. and SCHMAHL G., Appl. Optics, 15 (1976) 1883.
5. FISCHER P., EIMÜLLER T., SCHÜTZ G., DENBEAUX G., PEARSON A., JOHNSON L., ATTWOOD D., TSUNASHIMA S., KUMAZAWA M., TAKAGI N., KÖHLER M. and BAYREUTHER G., Rev. Sci. Instrum., 72 (2001) 2322.
6. JOHANSSON G. A., KHANNA S. M., MAIR A., MANNSTRÖM P., DENBEAUX G. and ULFENDAHL M., J. Microsc., 215 (2004) 203.
7. JACOBSEN C., WILLIAMS S., ANDERSON E., BROWNE M. T., BUCKLEY C. J., KIRZ J., KERN D., RIVERS M. and ZHANG X., Opt. Commum., 86 (1991) 351.
8. MICHETTE A. G., TURCU I. C. E., SCHULZ M. S., BROWNE M. T., MORRISON G. R., FLUCK P., BUCKLEY C. J. and FOSTER G. F., Rev. Sci. Instrum., 64 (1993) 1478.
9. BERGLUND M., RYMELL L., PEUKER M., WILHEIN T. and HERTZ H. M., J. Microsc., 197 (2000) 268.
10. SERES E., SERES J., KRAUSZ F. and SPIELMANN CH., Phys. Rev. Lett., 92 (2004) 163002.
11. WIELAND M., SPIELMANN CH., KLEINEBERG U., WESTERWALBESLOH TH., HEINZMANN U. and WILHEIN T., Ultramicroscopy, 102 (2005) 93.
12. SPIELMANN C., BURNETT N. H., SARTANIA S., KOPPITSCH R., SCHNÜRER M., KAN C., LENZNER M., WOBRAUSCHEK P. and KRAUSZ F., Science, 278 (1997) 661.
13. TSILIMIS G., BENESCH C., KUTZNER J. and ZACHARIAS H., J. Opt. Soc. Am. B, 20 (2003) 246.
14. Center of X-Ray Optics, Berkeley, http://www.cxro.lbl.gov/ optical_constants (2005).
15. WILHEIN T., REHBEIN S., HAMBACH D., BERGLUND M., RYMELL L. and HERTZ H. M., Rev. Sci. Instrum., 70 (1999) 1694.
16. ATTWOOD D. (Editor), Soft X-rays and Extreme Ultraviolet Radiation: Principles and Applica-tions, Vol. 1 (University Press, Cambridge) 1999, sect. 9.
17. WIELAND M., FRUEKE R., WILHEIN T., SPIELMANN CH., POHL M. and KLEINEBERG U., Appl. Phys. Lett., 81 (2002) 2520.