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1
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0002263712
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Target acquisition performance modeling of infrared imaging systems: Past, present, and future
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J. Ratches, R. Vollmerhausen, and R. Driggers, Target acquisition performance modeling of infrared imaging systems: past, present, and future," IEEE Sensors J. 1, 31-40 (2001).
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(2001)
IEEE Sensors J.
, vol.1
, pp. 31-40
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Ratches, J.1
Vollmerhausen, R.2
Driggers, R.3
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2
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0032337698
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TOD, a new method to characterize electro-optical system performance
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Infrared Imaging Systems: Design, Analysis, Modeling, and Testing IX.G.C. Hoist, ed.
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P. Bijl and J. Valeton, "TOD, a new method to characterize electro-optical system performance," in Infrared Imaging Systems: Design, Analysis, Modeling, and Testing IX.G.C. Hoist, ed., Proc. SPIE 3377, 182-193 (1998).
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Proc. SPIE
, vol.3377
, pp. 182-193
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Bijl, P.1
Valeton, J.2
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3
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0542395711
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TOD, the alternative to MRTD and MRC
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P. Bijl and J. Valeton, "TOD, the alternative to MRTD and MRC, " Opt. Eng. 37, 1984-1994 (1998).
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(1998)
Opt. Eng.
, vol.37
, pp. 1984-1994
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Bijl, P.1
Valeton, J.2
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4
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0032668159
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Guidelines for accurate TOD measurement
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Infrared Imaging Systems: Design, Analysis, Modeling, and Testing X, G. C. Holst, ed.
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P. Bijl and J. Valeton, "Guidelines for accurate TOD measurement, in Infrared Imaging Systems: Design, Analysis, Modeling, and Testing X, G. C. Holst, ed., Proc. SPIE 3701, 14-25 (1999).
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(1999)
Proc. SPIE
, vol.3701
, pp. 14-25
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Bijl, P.1
Valeton, J.2
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6
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0032686009
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Influence of sampling on target recognition and identification
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R. Vollmerhausen, R. Driggers, and B. O'Kane, "Influence of sampling on target recognition and identification," Opt. Eng. 38, 763-772 (1999).
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(1999)
Opt. Eng.
, vol.38
, pp. 763-772
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Vollmerhausen, R.1
Driggers, R.2
O'Kane, B.3
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8
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0000195483
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Performance comparison of rectangular (4-point) and diagonal (2-point) dither in under-sampled IRFPA imagers
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K. Krapels, R. Driggers, R. Vollmerhausen, and C. Halford, "Performance comparison of rectangular (4-point) and diagonal (2-point) dither in under-sampled IRFPA imagers," App. Opt. 40, 101-112 (2001).
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(2001)
App. Opt.
, vol.40
, pp. 101-112
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Krapels, K.1
Driggers, R.2
Vollmerhausen, R.3
Halford, C.4
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9
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84893987508
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Analysis of Sampled Imaging Systems, (Note Chap. 6 on superresolution) by J. Schuler and D. Scribner
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R. Vollmerhausen and R. Driggers, Analysis of Sampled Imaging Systems, Vol. TT39 of SPIE Tutorial Texts in Optical Engineering (SPIE, 2000), pp. 115-119. (Note Chap. 6 on superresolution) by J. Schuler and D. Scribner.
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SPIE Tutorial Texts in Optical Engineering (SPIE, 2000)
, vol.TT39
, pp. 115-119
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Vollmerhausen, R.1
Driggers, R.2
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10
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14544300087
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Superresolution performance for undersampled imagers
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R. Driggers, K. Krapels, S. Murrill, S. Young, M. Thielke, and J. Schuler, "Superresolution performance for undersampled imagers," Opt. Eng. 44, 14002 (2005).
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(2005)
Opt. Eng.
, vol.44
, pp. 14002
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Driggers, R.1
Krapels, K.2
Murrill, S.3
Young, S.4
Thielke, M.5
Schuler, J.6
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11
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0033684658
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TOD predicts target acquisition performance for staring and scanning thermal imagers
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Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XI, G. C. Holst, ed.
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P. Bijl, J. Valeton, and A. de Jong, "TOD predicts target acquisition performance for staring and scanning thermal imagers," in Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XI, G. C. Holst, ed., Proc. SPIE 4030, 96-103. (2000).
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(2000)
Proc. SPIE
, vol.4030
, pp. 96-103
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Bijl, P.1
Valeton, J.2
De Jong, A.3
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12
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0035758481
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Critical evaluation of test patterns for EO system performance characterization
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Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XII, G. C. Holst, ed.
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P. Bijl, J. Valeton, and M. Hogervorst, "Critical evaluation of test patterns for EO system performance characterization," in Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XII, G. C. Holst, ed., Proc. SPIE 4372, 27-38 (2001).
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(2001)
Proc. SPIE
, vol.4372
, pp. 27-38
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Bijl, P.1
Valeton, J.2
Hogervorst, M.3
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13
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0032690582
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Sampled imaging sensor design using the MTF squeeze model to characterize spurious response
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Infrared Imaging Systems: Design, Analysis, Modeling, and Testing X, G. C. Holst, ed.
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R. Driggers, R. Vollmerhausen, and B. O'Kane, "Sampled imaging sensor design using the MTF squeeze model to characterize spurious response," in Infrared Imaging Systems: Design, Analysis, Modeling, and Testing X, G. C. Holst, ed., Proc. SPIE 3701, 61-73 (1999).
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(1999)
Proc. SPIE
, vol.3701
, pp. 61-73
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Driggers, R.1
Vollmerhausen, R.2
O'Kane, B.3
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14
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0036907207
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2002 NVTherm improvements
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Infrared and Passive Millimeter-Wave Imaging Systems: Design, Analysis, Modeling, and Testing, R. Appleby, G. C. Hoist, and D. A. Wikner, eds.
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T. Maurer, R. Driggers, R. Vollmerhausen, and M. Friedman, "2002 NVTherm improvements," in Infrared and Passive Millimeter-Wave Imaging Systems: Design, Analysis, Modeling, and Testing, R. Appleby, G. C. Hoist, and D. A. Wikner, eds., Proc. SPIE 4719, 15-23 (2002).
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(2002)
Proc. SPIE
, vol.4719
, pp. 15-23
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Maurer, T.1
Driggers, R.2
Vollmerhausen, R.3
Friedman, M.4
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15
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17644369263
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Target detection cycle criteria when using the targeting task performance metric
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Electro-Optical and Infrared Systems: Technology and Applications, R. G. Driggers and D. A. Huckridge, eds.
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J. Hixson, E. Jacobs, and R. Vollmerhausen, "Target detection cycle criteria when using the targeting task performance metric," in Electro-Optical and Infrared Systems: Technology and Applications, R. G. Driggers and D. A. Huckridge, eds., Proc. SPIE 5612, 275-283 (2004).
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(2004)
Proc. SPIE
, vol.5612
, pp. 275-283
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Hixson, J.1
Jacobs, E.2
Vollmerhausen, R.3
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