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Volumn 5875, Issue , 2005, Pages 1-10

Characteristics and electrical addressing of optical Fabry-Perot displays

Author keywords

Fabry Perot; Image projection; Interference display; Optical light modulator; Optical switch; Passive matrix

Indexed keywords

CROSSTALK; DISPLAY DEVICES; ELECTROSTATICS; LIGHT MODULATORS; OPTICAL DESIGN; OPTICAL SWITCHES; OPTICAL SYSTEMS; REFRACTIVE INDEX;

EID: 29144487475     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.615703     Document Type: Conference Paper
Times cited : (1)

References (9)
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    • M. Panitz and W. Benecke, Electrostatic actuated interference filters as optical switches for projection display applications, Transducers 2003 Proc, Boston, June 8-12, 580-582, 2003
    • (2003) Transducers 2003 Proc , pp. 580-582
    • Panitz, M.1    Benecke, W.2
  • 2
    • 29144495032 scopus 로고    scopus 로고
    • Electrostatic actuated optical Fabry-Perot switches in passive matrix displays
    • 24.-29.01.2004
    • T. Knieling, M. Panitz, and W. Benecke, Electrostatic actuated optical Fabry-Perot switches in passive matrix displays, SPIE Photonics West 2004, 24.-29.01.2004, 5348-11 (2004)
    • (2004) SPIE Photonics West 2004 , pp. 5348-5411
    • Knieling, T.1    Panitz, M.2    Benecke, W.3
  • 5
    • 0026257716 scopus 로고
    • A miniature Fabry-Perot interferometer with a corrugated silicon diaphragm support
    • J.H. Jerman, D.J. Clift, and S.R. Mallinson, A miniature Fabry-Perot interferometer with a corrugated silicon diaphragm support, Sensors and Actuators A, Vol. 29, 151-158, 1991
    • (1991) Sensors and Actuators A , vol.29 , pp. 151-158
    • Jerman, J.H.1    Clift, D.J.2    Mallinson, S.R.3
  • 7
    • 0016027867 scopus 로고
    • Scanning limitations of liquid-crystal displays
    • P.M. Alt and P. Pleshko/Scanning limitations of liquid-crystal displays, IEEE Trans. Electron. Dev., 21(2), 1974
    • (1974) IEEE Trans. Electron. Dev. , vol.21 , Issue.2
    • Alt, P.M.1    Pleshko, P.2
  • 9
    • 0036350299 scopus 로고    scopus 로고
    • Charge transport in low stress Si-rich silicon nitride thin films
    • S. Habermehl and C. Carmignani, Charge Transport in Low Stress Si-rich Silicon Nitride Thin Films, Mat. Res. Soc. Symp. Proc. Vol. 687, B5.11.1-B5.11.6
    • Mat. Res. Soc. Symp. Proc. , vol.687
    • Habermehl, S.1    Carmignani, C.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.