-
2
-
-
0020602403
-
Contribution to analysis of the reflection grating method
-
Ritter, R.; Hahn, R.: Contribution to Analysis of the Reflection Grating Method. In: Optics and Lasers in Engineering, Vol. 4 (1983), No. 1, p. 33-44
-
(1983)
Optics and Lasers in Engineering
, vol.4
, Issue.1
, pp. 33-44
-
-
Ritter, R.1
Hahn, R.2
-
3
-
-
0035758685
-
Reflection grating method for 3D measurement of reflecting surfaces
-
Höfling, R.; Jüptner, W.; Kujawinska, M. (ed.): Optical Measurement for Industrial Inspection II: Applications in Production Engineering
-
Petz, M.; Ritter, R.: Reflection grating method for 3D measurement of reflecting surfaces. In: Höfling, R.; Jüptner, W.; Kujawinska, M. (ed.): Optical Measurement for Industrial Inspection II: Applications in Production Engineering, Proceedings of SPIE Vol. 4399 (2001), p. 35-41
-
(2001)
Proceedings of SPIE
, vol.4399
, pp. 35-41
-
-
Petz, M.1
Ritter, R.2
-
4
-
-
4444364881
-
Optical 3D measurement of reflecting free formed surfaces
-
VDI-Berichte 1694, Aachen
-
Petz, M.; Tutsch, R.: Optical 3D Measurement of Reflecting Free Formed Surfaces. In: VDI-Berichte 1694, International Symposium on Photonics in Measurement, Aachen, 2002, p. 329-332
-
(2002)
International Symposium on Photonics in Measurement
, pp. 329-332
-
-
Petz, M.1
Tutsch, R.2
-
5
-
-
19444376252
-
Reflection grating photogrammetry
-
VDI-Berichte 1844, Frankfurt
-
Petz, M.; Tutsch, R.: Reflection grating photogrammetry. In: VDI-Berichte 1844, International Symposium on Photonics in Measurement, Frankfurt, 2004, pp. 327 - 338
-
(2004)
International Symposium on Photonics in Measurement
, pp. 327-338
-
-
Petz, M.1
Tutsch, R.2
-
8
-
-
0003010252
-
A coded light approach for depth map acquisition
-
Hartmann, G. (ed.):, 8 Informatik-Fachberichte 125, Berlin: Springer
-
Wahl, F. M.: A Coded Light Approach for Depth Map Acquisition. In: Hartmann, G. (ed.):, 8. DGAM Symposium, Informatik-Fachberichte 125, Berlin: Springer, 1986, p. 12-17
-
(1986)
DGAM Symposium
, pp. 12-17
-
-
Wahl, F.M.1
-
9
-
-
0031322553
-
White light heterodyne principle for 3D-measurement
-
Loffelt, O. (ed.): Sensors, Sensor System and Sensor Data Processing
-
Reich, C.; Ritter, R.; Thesing, J.: White light heterodyne principle for 3D-measurement. In: Loffelt, O. (ed.): Sensors, Sensor System and Sensor Data Processing, Proceedings of SPIE Vol. 3100 (1997), p. 236-244
-
(1997)
Proceedings of SPIE
, vol.3100
, pp. 236-244
-
-
Reich, C.1
Ritter, R.2
Thesing, J.3
-
10
-
-
0032225309
-
Deformation measurement by optical field methods in material testing and for verification of numerical simulation
-
Rastogi, P.K. (ed.)
-
Ritter, R.: Deformation measurement by optical field methods in material testing and for verification of numerical simulation. In: Rastogi, P.K. (ed.): Proc. International Conference on applied optical metrology, 1998, p. 24-33
-
(1998)
Proc. International Conference on Applied Optical Metrology
, pp. 24-33
-
-
Ritter, R.1
|