메뉴 건너뛰기




Volumn , Issue 1694, 2002, Pages 327-332

Optical 3D Measurement of Reflecting Free Formed Surfaces

(2)  Petz, M a   Tutsch, R a  

a NONE

Author keywords

[No Author keywords available]

Indexed keywords

CURVATURE; FREE FORMED SURFACES; NON-REFLECTING SURFACES; OBJECT SURFACE;

EID: 4444364881     PISSN: 00835560     EISSN: None     Source Type: Book Series    
DOI: None     Document Type: Conference Paper
Times cited : (7)

References (6)
  • 2
    • 51249193830 scopus 로고
    • Krümmungsmessung an belasteten Platten nach dem Ligtenbergschen Moiré-Verfahren
    • Rieder, G., Ritter, R.: Krümmungsmessung an belasteten Platten nach dem Ligtenbergschen Moiré-Verfahren, Forschung Ing.-Wes. 31 (1965) No. 2, pp. 33-44
    • (1965) Forschung Ing.-Wes. , vol.31 , Issue.2 , pp. 33-44
    • Rieder, G.1    Ritter, R.2
  • 3
    • 0020602403 scopus 로고
    • Contribution to Analysis of Reflection Grating Method
    • Ritter, R., Hahn, R.: Contribution to Analysis of Reflection Grating Method, Optics and Lasers in Engineering 4 (1983) No. 1, pp. 13-24
    • (1983) Optics and Lasers in Engineering , vol.4 , Issue.1 , pp. 13-24
    • Ritter, R.1    Hahn, R.2
  • 4
    • 0035758685 scopus 로고    scopus 로고
    • Reflection grating method for 3D measurement of reflecting surfaces
    • Höfling, R., Jüptner, W., Kujawinska, M. (ed.): Optical Measurement for Industrial Inspection II: Applications in Production Engineering
    • Petz, M., Ritter, R.: Reflection grating method for 3D measurement of reflecting surfaces, In Höfling, R., Jüptner, W., Kujawinska, M. (ed.): Proc. SPIE Vol. 4399 (2001) - Optical Measurement for Industrial Inspection II: Applications in Production Engineering
    • (2001) Proc. SPIE , vol.4399
    • Petz, M.1    Ritter, R.2
  • 6
    • 0003010252 scopus 로고
    • A Coded Light Approach for Depth Map Acquisition
    • In Hartmann, G. (ed.): Informatik-Fachberichte 125, Springer, Berlin
    • Wahl, F. M.: A Coded Light Approach for Depth Map Acquisition, In Hartmann, G. (ed.): 8. DGAM Symposium, Informatik-Fachberichte 125, Springer, Berlin 1986, S. 12-17
    • (1986) 8. DGAM Symposium , pp. 12-17
    • Wahl, F.M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.