Reflection grating photogrammetry

VDI Berichte

Volumn , Issue 1844, 2004, Pages

  Petz, Marcus ^a,b   Tutsch, R ^a  

^a Inst F Produktionsmesstechnik ^*

^b TECHNICAL UNIVERSITY OF BRAUNSCHWEIG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

LIGHT PROJECTION SYSTEMS; PASSIVE PATTERN PROJECTION; STEREO-PHOTOGRAMMETRIC CAMERA SYSTEM; SURFACE CONTOURS;

CAMERAS; DIFFRACTION GRATINGS; IMAGING SYSTEMS; INTERFEROMETRY; LIQUID CRYSTAL DISPLAYS; PHASE SHIFT; REFRACTIVE INDEX; SENSORS; WAVEFRONTS;

PHOTOGRAMMETRY;

EID: 19444376252     PISSN: 00835560     EISSN: None     Source Type: Book Series    
DOI: None     Document Type: Conference Paper

References (9)

1. Luhmann, Th.: Nahbereichsphotogrammetrie : Grundlagen. Methoden und Anwendungen. Heidelberg : Wichmann, 2000
2. Ritter, R.; Hahn, R.: Contribution to Analysis of the Reflection Grating Method. In: Optics and Lasers in Engineering, Vol. 4 (1983), No. 1, p. 33-44
3. Petz, M.; Ritter, R.: Reflection grating method for 3D measurement of reflecting surfaces. In: Höfling, R.; Jüptner, W.; Kujawinska, M. (ed.): Proc. SPIE Vol. 4399 (2001) - Optical Measurement for Industrial Inspection II: Applications in Production Engineering, p. 35-41
4. Petz, M.; Tutsch, R.: Optical 3D Measurement of Reflecting Free Formed Surfaces. In: VDI-Berichte 1694, International Symposium on Photonics in Measurement, Aachen, 2002, p. 329-332
5. Reich, C.: Vollsẗndige optische Formerfassung durch photogrammetrische Verknüpfung von Teilflächen. PhD thesis, Technische Universität Braunschweig, 1999
6. Osten, W.: Digitale Verarbeitung und Auswertung von Interferenzbildern. Berlin : Akademie-Verlag, 1991, p. 124-146
7. Wahl, F. M.: A Coded Light Approach for Depth Map Acquisition. In: Hartmann, G. (ed.): 8. DGAM Symposium, Informatik-Fachberichte 125, Berlin : Springer, 1986, p. 12-17
8. Reich, C.; Ritter, R.; Thesing, J.: White light heterodyne principle for 3D-measurement. In: Loffelt, O. (ed.): Proc. SPIE Vol. 3100 (1997) - Sensors, Sensor System and Sensor Data Processing, p. 236-244
9. Ritter, R.: Deformation measurement by optical field methods in material testing and for verification of numerical simulation. In: Rastogi, P.K. (ed.): Proc. International Conference on applied optical metrology, 1998, p. 24-33