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Volumn 79, Issue 11, 2005, Pages 1269-1273

Fabrication and characterization of CdSe thin film transistor (TFT) using Y2O3 gate insulator

Author keywords

CdSe; Thin film transistors (TFTs); Y2O3

Indexed keywords


EID: 29144458975     PISSN: 02529262     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (4)

References (18)
  • 14
    • 11644318555 scopus 로고
    • (eds) G Hass and R E Thun (New York: Academic)
    • P K Weimer Physics of Thin Films Vol. II (eds) G Hass and R E Thun (New York: Academic) p147 (1964)
    • (1964) Physics of Thin Films , vol.2 , pp. 147
    • Weimer, P.K.1
  • 16
    • 0015399646 scopus 로고
    • 36 299 (1976) and 38 151 (1978)
    • J C Anderson Thin Solid Films 12 1 (1972); 36 299 (1976) and 38 151 (1978)
    • (1972) Thin Solid Films , vol.12 , pp. 1
    • Anderson, J.C.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.