Semi-empirical simulation model for polycrystalline thin film transistors

Solid-State Electronics

Volumn 43, Issue 11, 1999, Pages 2047-2055

  Wright, S W ^a   Lee, M J ^a   Roberts, P K ^b   Judge, C P ^a  

^a IMPERIAL COLLEGE LONDON   (United Kingdom)

^b TECH Connect Ltd   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTRIC PROPERTIES; LINEAR INTEGRATED CIRCUITS; LIQUID CRYSTAL DISPLAYS; POLYCRYSTALLINE MATERIALS; SEMICONDUCTOR DEVICE MODELS; SENSORS; THIN FILM CIRCUITS;

ANALOGUE CIRCUITS; CIRCUIT SIMULATION; ELECTRONIC INTEGRATED CIRCUIT DESIGN; SOFTWARE PACKAGE SPICE; X RAY SENSORS;

THIN FILM TRANSISTORS;

EID: 0033225345     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0038-1101(99)00188-4     Document Type: Article

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