Bis(salicyladiminato)Ni(II) Schiff base complexes, grafted on H-terminated Si(100) surfaces, observed by scanning near-field optical/atomic force microscopy (SNOM/AFM)

Physica Status Solidi C: Conferences

Volumn 2, Issue 12, 2005, Pages 4093-4096

  Ustione, A ^a   Cricenti, A ^a,b   Condoreffi, G G ^c   Motta, A ^c   Di Bella, S ^c  

^a CNR   (Italy)

^b VANDERBILT UNIVERSITY   (United States)

^c UNIVERSITY OF CATANIA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

AMINES; ATOMIC FORCE MICROSCOPY; IMAGE ANALYSIS; MONOLAYERS; ORGANOMETALLICS; SELF ASSEMBLY; SYNTHESIS (CHEMICAL);

CHEMISORBED SYSTEMS; HIGH RESOLUTION; MONOLAYER SURFACE; SCHIFFS BASE;

COMPLEXATION;

EID: 29144457338     PISSN: 16101634     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1002/pssc.200562202     Document Type: Article

References (34)

1. E. Betzig and J. K. Trautman, Science 257, 189 (1992).
2. E. Betzig, P. L. Finn, and J. S. Weiner, Appl. Phys. Lett. 60, 2484 (1992).
3. J. Barenz, O. Hollricher, and O. Marti, Rev. Sci. Instrum. 67, 1912 (1996).
4. A. Cricenti, R. Generosi, C. Barchesi, M. Luce, and M. Rinaldi, Rev. Sci. Instrum. 69, 3240 (1998).
5. C. Barchesi, A. Cricenti, R. Generosi, C. Giammichele, M. Luce, and M. Rinaldi, Rev. Sci. Instrum. 68, 3799 (1997).
6. P. Perfetti, A. Cricenti, and R. Generosi, Surf. Rev. Lett. 7, 411 (2000).
7. Y. Bai, J. D. White, G. Zhang, G. Chen, and X. Hou, Appl. Phys. Lett. 75, 2731 (1999).
8. P. K. Wie and W. S. Faim, J. Appl. Phys. 83, 3461 (1998).
9. R. L. Carrol and C. B. Gorman, Angew. Chem. Int. Ed. 41, 4378 (2002).
10. M. A. Ratner, Mater. Today 5(2), 20 (2002).
11. C. Joachim, J. K. Gimzewski, and A. Aviram, Nature 408, 541 (2000).
12. Organized Monolayers and Assemblies: Structure, Processes, and Function, edited by D. Möbius and R. Miller (Elsevier, Amsterdam, 2002).
13. A. Ulman, Chem. Rev. 96, 1533 (1996).
14. A. Ulman, An Introduction to Ultrathin Organic Films: From Langmuir-Blodgett to Self-Assembly (Academic Press, New York, 1991).
15. D. Cahen and G. Hodes, Adv. Mater. 14, 789 (2002).
16. A. B. Sieval, A. L. Demirel, J. W. M. Nissink, M. R. Linford, J. H. van der Maas, W. H. de Jeu, H. Zuilhof, and E. J. R. Sudhölter, Langmuir 14, 1759 (1988).
17. M. P. Stewart, F. Maya, D. V. Kosynkin, S. M. Dirk, J. J. Stapleton, C. L. McGuiness, D. L. Allara, and J. M. Tour, J. Am. Chem. Soc. 126, 370 (2004).
18. F. Tao, W. S. Sim, G. Q. Xu, and M. H. Qiao, J. Am. Chem. Soc. 123, 9397 (2001).
19. Y. P. Zhang, L. Yang, Y. H. Lai, G. Q. Xu, and X. S. Wang, Appl. Phys. Lett. 84, 401 (2004).
20. A. J. Mayne, M. Lastapis, G. Baffou, L. Soukiassian, G. Comtet, L. Hellner, and G. Dujardin, Phys. Rev. B 69, 45409 (2004).
21. G. G. Condorelli, A. Motta, I. L. Fragalà, F. Giannazzo, V. Ranieri, A. Caneschi, and D. Gatteschi, Angew. Chem. Int. Ed. 43, 4081 (2004).
22. S. Di Bella, Chem. Soc. Rev. 30, 355 (2001).
23. S. Di Bella, I. Fragalà, I. Ledoux, and J. Zyss, Chem. Eur. J. 7, 3738 (2001).
24. S. Di Bella, I. Fragalà, I. Ledoux, M. A. Diaz-Garcia, and T. J. Marks, J. Am. Chem. Soc. 119, 9550 (1997).
25. R. J. Colton, J. Vac. Sci. Tech. B 22, 1609 (2004).
26. S. Di Bella, to be published.
27. G. Binning, C. F. Quate, and Ch. Gerber, Phys. Rev. Lett. 56, 930 (1986).
28. H. Y. Nie, T. Shimizu, and H. Tokumoto, J. Vac. Sci. Technol. B 12, 1843 (1994).
29. S. M. Hues, C. F. Draper, and R. J. Colton, J. Vac. Sci. Technol. B 12, 2211 (1994).
30. A detailed discussion of the mechanism of optical contrast observed in SNOM images can be found in: NATO ASI Series "Near Field Optics", eds. D. W. Pohl and D. Courjon (Kluwer Academic Press, 1992), Vol. 262.
31. E. Betzig, P. L. Finn, and J. S. Wiener, Appl. Phys. Lett. 60, 2484 (1994).
32. A. Cricenti and R. Generosi, Rev. Sci. Instrum. 66, 2843 (1995).
33. A. Cricenti, R. Generosi, C. Barchesi, M. Luce, and M. Rinaldi, Rev. Sci. Instrum. 69, 3240 (1998).
34. S. Di Bella, I. Fragalà, N. Leonardi, and S. Sortino, Inorg. Chim. Acta 357, 3865 (2004).