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Volumn T115, Issue , 2005, Pages 454-456
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EXAFS characterization of nickel clusters in Ni/Si3N4 sputtered thin films
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Author keywords
[No Author keywords available]
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Indexed keywords
COORDINATION REACTIONS;
EXTENDED X RAY ABSORPTION FINE STRUCTURE SPECTROSCOPY;
FILM THICKNESS;
MAGNETIZATION;
MICROSTRUCTURE;
SPUTTER DEPOSITION;
COORDINATION NUMBER;
LAYER THICKNESS;
NICKEL CLUSTERS;
THIN FILMS;
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EID: 29144431864
PISSN: 02811847
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1238/Physica.Topical.115a00454 Document Type: Article |
Times cited : (1)
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References (14)
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