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Volumn T115, Issue , 2005, Pages 454-456

EXAFS characterization of nickel clusters in Ni/Si3N4 sputtered thin films

Author keywords

[No Author keywords available]

Indexed keywords

COORDINATION REACTIONS; EXTENDED X RAY ABSORPTION FINE STRUCTURE SPECTROSCOPY; FILM THICKNESS; MAGNETIZATION; MICROSTRUCTURE; SPUTTER DEPOSITION;

EID: 29144431864     PISSN: 02811847     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1238/Physica.Topical.115a00454     Document Type: Article
Times cited : (1)

References (14)
  • 8
    • 0037179736 scopus 로고    scopus 로고
    • Vila M et al 2002 Vacuum 67 513
    • (2002) Vacuum , vol.67 , Issue.3-4 , pp. 513
    • Vila, M.1
  • 10
    • 85083126854 scopus 로고    scopus 로고
    • Klementev K V VIPER for Windows freeware http://www.desy.de/∼klmn/ viper.html
    • Klementev, K.V.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.