Physical characterization of ZnO nanorods grown on Si from aqueous solution and annealed at various atmospheres

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 23, Issue 6, 2005, Pages 2347-2350

  Yang, Chih Cheng ^a   Chen, San Yuan ^a   Lee, Hsin Yi ^b  

^a NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

^b NATIONAL SYNCHROTRON RADIATION RESEARCH CENTER   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CRYSTAL DEFECTS; EPITAXIAL GROWTH; PARAMAGNETIC RESONANCE; PHOTOLUMINESCENCE; RAMAN SPECTROSCOPY; SOLUTIONS; ZINC OXIDE;

DEFECT DENSITY; NANORODS; NONPARAMAGNETIC;

NANOSTRUCTURED MATERIALS;

EID: 29044451144     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.2102967     Document Type: Article

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