메뉴 건너뛰기




Volumn 13, Issue 8, 2005, Pages 691-695

A novel silicon texturization method based on etching through a silicon nitride mask

Author keywords

Light trapping; Siliconl; Texturization

Indexed keywords

CHEMICAL VAPOR DEPOSITION; ETCHING; PHOTOCONDUCTIVITY; SILICON NITRIDE;

EID: 29044448552     PISSN: 10627995     EISSN: None     Source Type: Journal    
DOI: 10.1002/pip.632     Document Type: Article
Times cited : (29)

References (14)
  • 4
    • 0033077867 scopus 로고    scopus 로고
    • Investigation of acidic texturization for multicrystalline silicon solar cells
    • Nishimoto Y, Ishihara T, Namba K. Investigation of acidic texturization for multicrystalline silicon solar cells. Journal of the Electrochemical Society 1999; 146: 457-461.
    • (1999) Journal of the Electrochemical Society , vol.146 , pp. 457-461
    • Nishimoto, Y.1    Ishihara, T.2    Namba, K.3
  • 7
    • 29044442829 scopus 로고    scopus 로고
    • Semiconductor texturing process. International patent application WO03047004 June
    • Weber KJ, Blakers AW. Semiconductor texturing process. International patent application WO03047004 (June 2003).
    • (2003)
    • Weber, K.J.1    Blakers, A.W.2
  • 9
    • 29044445066 scopus 로고    scopus 로고
    • Semiconductor wafer processing to increase the usable planar surface area. International Patent Application WO0245143, June
    • Weber KJ, Blakers AW. Semiconductor wafer processing to increase the usable planar surface area. International Patent Application WO0245143, June 2002.
    • (2002)
    • Weber, K.J.1    Blakers, A.W.2
  • 10
    • 0014800514 scopus 로고
    • Cleaning solutions based on hydrogen peroxide for use in silicon semiconductor technology
    • Kern W, Puotinen DA. Cleaning solutions based on hydrogen peroxide for use in silicon semiconductor technology. RCA Review 1970; 187-206.
    • (1970) RCA Review , pp. 187-206
    • Kern, W.1    Puotinen, D.A.2
  • 11
    • 0036600105 scopus 로고    scopus 로고
    • Enhancement of absorption in silicon films using a pressed glass substrate texture
    • Campbell P. Enhancement of absorption in silicon films using a pressed glass substrate texture. Glass Technology 2002; 43: 107-111.
    • (2002) Glass Technology , vol.43 , pp. 107-111
    • Campbell, P.1
  • 12
    • 0000513411 scopus 로고    scopus 로고
    • Contactless determination of current-voltage characteristics and minority-carrier lifetimes in semiconductors from quasi-steady-state photoconductance data
    • Sinton RA, Cuevas A. Contactless determination of current-voltage characteristics and minority-carrier lifetimes in semiconductors from quasi-steady-state photoconductance data. Applied Physics Letters 1996; 69: 2510-2512.
    • (1996) Applied Physics Letters , vol.69 , pp. 2510-2512
    • Sinton, R.A.1    Cuevas, A.2
  • 13
    • 0000612857 scopus 로고    scopus 로고
    • Generalized analysis of quasi-steady-state and quasi-transient measurements of carrier lifetimes in semiconductors
    • Nagel H, Berge C, Aberle AG. Generalized analysis of quasi-steady-state and quasi-transient measurements of carrier lifetimes in semiconductors. Journal of Applied Physics 1999; 86: 6218-6221.
    • (1999) Journal of Applied Physics , vol.86 , pp. 6218-6221
    • Nagel, H.1    Berge, C.2    Aberle, A.G.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.