Distorted surface topography observed by atomic force microscopy

Measurement: Journal of the International Measurement Confederation

Volumn 39, Issue 1, 2006, Pages 12-15

  Li, L X ^a   Liu, R P ^a   Xu, Z ^a   Xu, Y ^a   Wang, W K ^a,b   Fan, C Z ^b  

^a YANSHAN UNIVERSITY   (China)

^b INSTITUTE OF PHYSICS   (China)

Author keywords

AFM; Au film; Image distortion

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRIC DISTORTION; GOLD; MAGNETRON SPUTTERING; THIN FILMS;

AU FILMS; IMAGE DISTORTION; PROBE TIP;

SURFACE TOPOGRAPHY;

EID: 28944448042     PISSN: 02632241     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.measurement.2005.10.005     Document Type: Article

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