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Volumn 3, Issue , 2005, Pages 379-383

Real-time low-energy electron microscopy study of Ga adsorption and facet array formation on Si(113)

Author keywords

Ga; Low energy electron diffraction (LEED); Low energy electron microscopy (LEEM); Nanoscale patterning; Self organization; Si(113)

Indexed keywords

ELECTRON MICROSCOPY; GALLIUM; LOW ENERGY ELECTRON DIFFRACTION; NANOSTRUCTURED MATERIALS; SILICON;

LOW-ENERGY ELECTRON MICROSCOPY (LEEM); NANOSCALE PATTERNING; SELF-ORGANIZATION; SI(113);

ADSORPTION;

EID: 28844487070 PISSN: 13480391 EISSN: 13480391 Source Type: Journal
DOI: 10.1380/ejssnt.2005.379 Document Type: Conference Paper

Times cited : (6)

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